Microelectronics Reliability

About the journal

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the …

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$2260

Article publishing charge
for open access

87 days

Review time

96 days

Submission to acceptance

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Editor-in-Chief

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Dr. Bongtae Han

University of Maryland at College Park, Department of Mechanical Engineering, 2181 Glenn L. Martin Hall, Building 088, 20742-0001, College Park, Maryland, United States of America, Fax: 301-314-9477

Articles

Special issues and article collections

Boyhood in 21st Century Educative Contexts

Edited by Garth Stahl, Amanda Keddie, Laura Scholes

3 July 2024

Rethinking educational practices and responsibilities in the light of digitalisation

Edited by Lisa Paleczek, Eva Pölzl-Stefanec, Kathrin Otrel-Cass

15 September 2022

Neoliberalism, Education Inequity and Improvement

Edited by Tien-Hui Chiang, Alison MacKenzie

22 July 2022

Motivation of Higher Education Faculty: Theoretical Approaches, Empirical Evidence, and Future Directions

Edited by Martin Daumiller, Robert Stupnisky, Stefan Janke

22 July 2022

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